Analysis at the atomic level - The atom probe field-ion microscope
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چکیده
منابع مشابه
Analysis at the Atomic Level: The Atom Probe Field-Ion Microscope
Figure 2. Angular distributions of inelastic scattering around the undiffracted beam and around a beam diffracted through an angle a. The shaded area represents the contribution from the diffracted beam to the intensity collected by an on-axis aperture of semi-angle A3. [6] Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1986). [7] Steele, J...
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János Kokavecz,1,* Othmar Marti,2 Péter Heszler,3,4 and Ádám Mechler5,† 1Department of Optics and Quantum Electronics, University of Szeged, P.O. Box 406, H-6701 Szeged, Hungary 2Department of Experimental Physics, University of Ulm, Albert-Einstein-Allee 11 D-89069 Ulm, Germany 3Research Group on Laser Physics of the Hungarian Academy of Sciences, P.O. Box 406, H-6701 Szeged, Hungary 4The Ångs...
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ژورنال
عنوان ژورنال: Journal of Research of the National Bureau of Standards
سال: 1988
ISSN: 0160-1741
DOI: 10.6028/jres.093.083